Define synthetic measurement corruptions for stress testing

Usage

synthetic_corruption_plan(
  missingness = 0,
  pupil_dropout = 0,
  gaze_offset_x = 0,
  gaze_offset_y = 0,
  sampling_jitter_sd = 0,
  aoi_label_noise = 0,
  device_shift = 0,
  trial_drop = 0,
  seed = 1L
)

Arguments

missingness: Generic missingness proportion.
pupil_dropout: Pupil dropout proportion.
gaze_offset_x, gaze_offset_y: Additive gaze-coordinate offsets.
sampling_jitter_sd: Timestamp jitter SD in timestamp units.
aoi_label_noise: Proportion of AOI labels randomly reassigned.
device_shift: Additive shift for a declared device-sensitive numeric column.
trial_drop: Proportion of rows/trials removed.
seed: Seed.